Re: using custom scan nodes to prototype parallel sequential scan

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От David Rowley
Тема Re: using custom scan nodes to prototype parallel sequential scan
Дата
Msg-id CAApHDvrydD0Wp89Y_TF4mx0+pWSdzomat3wWTpE-i_oEZEPyaA@mail.gmail.com
обсуждение исходный текст
Ответ на Re: using custom scan nodes to prototype parallel sequential scan  (Simon Riggs <simon@2ndQuadrant.com>)
Ответы Re: using custom scan nodes to prototype parallel sequential scan  (Atri Sharma <atri.jiit@gmail.com>)
Re: using custom scan nodes to prototype parallel sequential scan  (Simon Riggs <simon@2ndQuadrant.com>)
Re: using custom scan nodes to prototype parallel sequential scan  (Jim Nasby <Jim.Nasby@BlueTreble.com>)
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Дерево обсуждения
On Tue, Nov 11, 2014 at 9:29 PM, Simon Riggs <simon@2ndquadrant.com> wrote:

This plan type is widely used in reporting queries, so will hit the
mainline of BI applications and many Mat View creations.
This will allow SELECT count(*) FROM foo to go faster also.


We'd also need to add some infrastructure to merge aggregate states together for this to work properly. This means that could also work for avg() and stddev etc. For max() and min() the merge functions would likely just be the same as the transition functions. 

Regards

David Rowley

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